Research & Development > Innovative Sources for SIMS

Technical Publications

A High Brightness Source for Nano-Probe Secondary Ion Mass Spectrometry
N. S. Smith, P. P. Tesch, N. P. Martin and D. E. Kinion.
Applied Surface Science - In Press
Presented at the 17th International SIMS Conference in Kanazawa. Japan, Nov. 2007.

SIMS Workshop Presentation (Power Point file)
Presented at the 2008 SIMS Workshop in San Antonio, Texas.

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